diffraction techniques

This document discusses material characterization testing techniques. It describes techniques such as macroscopic and microscopic observations, optical microscopy, electron microscopy including SEM and TEM, diffraction techniques, spectroscopic techniques, electrical techniques, and magnetic techniques. It focuses on X-ray diffraction analysis (XRD) providing details on how it works, its primary uses in identifying materials based on diffraction patterns and determining structural properties like strain, phase composition, and preferred orientation. XRD is also described as a non-destructive technique used to determine atomic arrangement, measure thickness of thin films, and determine orientation of single crystals.