Electron microscopy (SEM)

This document discusses material characterization testing techniques. It focuses on scanning electron microscopy (SEM) as one such technique. It provides an introduction to SEM, explaining that it produces images using a focused electron beam interacting with sample atoms. The principles of SEM are described. Sample preparation requirements are outlined, such as size, vacuum compatibility, and mounting. The document then describes the specimen loading, vacuum creation, magnification, and microstructure examination processes involved in SEM.